Apparatus, system, and control method for measuring LED panel
AssigneeSamsung Electronics Co., Ltd.
InventorsKwangdon Kim, Seihan Park, Jaehee Kwak, Chanyul Kim, Dubok Park, Cheolseong Park, Sangwook Baek
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AssigneeSamsung Electronics Co., Ltd.
InventorsKwangdon Kim, Seihan Park, Jaehee Kwak, Chanyul Kim, Dubok Park, Cheolseong Park, Sangwook Baek
Estimating the term…
Disclosed are an apparatus, a system, and a control method for measuring an LED panel. The method for measuring an LED panel comprises the steps of: capturing an image of an LED panel displayed in a preset color; classifying each pixel of the LED panel from the captured image of the LED panel into pixel regions having different sizes according to a predetermined threshold brightness value; obtaining a tristimulus value of each pixel by using the data of the classified pixel regions and a trained artificial intelligence model; and obtaining the luminance and chrominance of each pixel on the basis of the obtained tristimulus value.
A method for measuring an light-emitting diode (LED) panel, the method comprising:
A light-emitting diode (LED) panel measuring apparatus comprising:
A light-emitting diode (LED) panel measuring system comprising:
A non-transitory computer readable medium having instructions stored therein, which when executed by a processor cause the processor to execute a method of measuring a light-emitting diode (LED) panel, the method comprising:
Dependencies are inferred from the claim text.