Test pattern generation systems and methods
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsFu-An Tien, Hsu-Ting Huang, Ru-Gun Liu
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsFu-An Tien, Hsu-Ting Huang, Ru-Gun Liu
Estimating the term…
Systems and methods are provided for generating test patterns. In various embodiments, systems and methods are provided in which machine learning is utilized to generate the test patterns in a manner so that the test patterns conform with design rule check (DRC) specified for a particular semiconductor manufacturing process or for particular types of devices. A test pattern generation system includes test pattern generation circuitry which receives a noise image. The test pattern generation generates a pattern image based on the noise image, and further generates a test pattern based on the pattern image. The test pattern is representative of geometric shapes of an electronic device design layout that is free of design rule check violations.
A method, comprising:
A test pattern generation system, comprising:
A method, comprising:
Dependencies are inferred from the claim text.