Rectenna array for detecting power radiated pattern of microwave or millimeter-wave signals
AssigneeKeysight Technologies, Inc.
InventorsZhu Wen, Xiong Bin Liao, Li Cao, Zi Quan Bai, Sheng Qi Zhang
Life of this patent
Estimating the term…
Loading patent…
AssigneeKeysight Technologies, Inc.
InventorsZhu Wen, Xiong Bin Liao, Li Cao, Zi Quan Bai, Sheng Qi Zhang
Estimating the term…
A system is provided for measuring a power radiated pattern of an incident radio frequency (RF) signal indicating spatial distribution characteristics of a device under test (DUT). The system includes multiple antenna elements arranged in an array, where the antenna elements include antennas and diodes coupled to the antennas, respectively. Each antenna has a radar cross-section (RCS) that is too small for the antenna elements to operate in a reflect mode. Each diode is zero biased, such that the diodes receive the incident RF signal through the antennas to which the diodes are respectively coupled, and rectify the incident RF signal to DC voltages that are proportional to power of the incident RF signal, enabling the antenna elements to operate in a detect mode.
A system for measuring a power radiated pattern of an incident radio frequency (RF) signal indicating spatial distribution characteristics of a device under test (DUT), the system comprising:
A system for measuring a power radiated pattern of an incident radio frequency (RF) signal indicating spatial distribution characteristics of a device under test (DUT), the system comprising:
A system for measuring a power radiated pattern of an incident radio frequency (RF) signal indicating spatial distribution characteristics of a device under test (DUT), the system comprising:
Dependencies are inferred from the claim text.