Integrated circuit testing system and method

A method of testing an integrated circuit, the method comprising:

• connecting a first conductive element to a ground voltage;
• directly physically contacting the first conductive element with a plurality of first conductive structures without marring any of the plurality of first conductive structures;
• supplying, through each of the plurality of first conductive structures, a corresponding supply voltage to the first conductive element, wherein a first supply voltage supplied through a first conductive structure of the plurality of first conductive structures is different from a second supply voltage supplied through a second conductive structure of the plurality of first conductive structures;
• measuring a current flow through each of the plurality of first conductive structures based on the corresponding supply voltage independent of current flow through any other first conductive structure of the plurality of conductive structures;
• and
• generating a report indicating whether each of the plurality of first conductive structures is capable of carrying a corresponding test voltage based on feedback from a corresponding test circuit.

An integrated circuit testing system comprising:

• a first conductive element configured to receive a ground voltage, wherein the first conductive element comprises a non-marking material;
• a second conductive element configured to receive the ground voltage;
• a plurality of first conductive structures in direct physical contact with the first conductive element;
• a plurality of second conductive structures in contact with the second conductive element;
• a plurality of first test circuits, wherein each test circuit of the plurality of first test circuits is configured to supply a test voltage to the first conductive element through a corresponding first conductive structure of the plurality of first conductive structures, and each of the plurality of first test circuits is configured to measure a current flow through each of the plurality of first conductive structures based on the corresponding supply voltage independent of current flow through any other first conductive structure of the plurality of conductive structures;
• a plurality of second test circuits, wherein each test circuit of the plurality of second test circuits is configured to supply the test voltage to the second conductive element through a corresponding first conductive structure of the plurality of second conductive structures;
• and
• a controller configured to control each of the plurality of first test circuits for supplying the test voltage to the first conductive element, and to control each of the plurality of second test circuits for supplying the test voltage to the second conductive element.