Test pin structure

Abstract

This invention discloses a test pin structure comprising a main body end, with a first elastic pin and a second elastic pin extending from the main body end on the same side, wherein the first elastic pin extends obliquely upward from one end of the main body end; the other end of the first elastic pin is connected to a counteracting pin portion; and a needle tip is vertically positioned at the other end of the counteracting pin portion; a pin is vertically oriented downward at the other end of the second elastic pin; this invention reduces the sliding distance of the needle tip by incorporating a counteracting pin portion that moves in the opposite direction to the first elastic pin, and the pressure return force generated by the contact forces of the first elastic pin and the counteracting pin portion drives the needle tip to be inserted into the chip. This way, when the pressure return force drives the needle tip to be inserted into the chip, it avoids scratching the chip surface, and the magnitude of the pressure return force only affects the depth of insertion into the chip, without affecting the contact surface for testing; the left and right sliding of the needle tip is used to clean the contact surface of the needle tip.

Dependencies are inferred from the claim text.