X-ray inspection apparatus and x-ray inspection system
AssigneeAnritsu Corporation
InventorsItaru Miyazaki, Eiji Tsujimura
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AssigneeAnritsu Corporation
InventorsItaru Miyazaki, Eiji Tsujimura
Estimating the term…
To provide an X-ray inspection apparatus capable of obtaining a clear transmission image with less noise without reducing a conveyance speed of an inspection object. There is provided an X-ray inspection apparatus in which an X-ray generator and an X-ray detector are disposed to face each other with a conveyance path interposed between the X-ray generator and the X-ray detector, conveyance path through which inspection objects that are sequentially conveyed pass. The X-ray generator and the X-ray detector are configured to move back and forth in a conveyance direction of the inspection object and an opposite direction thereof. The X-ray detector captures an image of the inspection object while the X-ray generator and the X-ray detector moves in the conveyance direction from an image capturing start position to an image capturing end position at a speed equal to the conveyance speed of the inspection object.
An X-ray inspection apparatus comprising:
Dependencies are inferred from the claim text.