X-ray inspection apparatus
AssigneeAnritsu Corporation
InventorsTakeshi Yamazaki, Takashi Kanai
Life of this patent
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AssigneeAnritsu Corporation
InventorsTakeshi Yamazaki, Takashi Kanai
Estimating the term…
An X-ray inspection apparatus includes: a transportation unit that transports an object through an inspection area; an X-ray generation source; an X-ray detection unit; an image data generation unit that generates image data from an output of the X-ray detection unit; a good or not determination unit that performs quality inspection of the object based on the generated image data and a predetermined criterion; and a control unit that controls the inspection, wherein the control unit switches between an inspection mode and a calibration mode in which calibration data for bringing into uniformity the brightness of the image is generated. The control unit includes a calibration data generation unit that generates calibration data based on image data generated before and after a calibration member is inspected in the calibration mode, and a correction unit that corrects the image data of the object, based on the calibration data.
An X-ray inspection apparatus, comprising:
Dependencies are inferred from the claim text.