X-ray inspection apparatus, X-ray inspection system, and X-ray inspection method
AssigneeIshida Co., Ltd.
InventorsKeisuke Yoshida, Futoshi Yurugi
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AssigneeIshida Co., Ltd.
InventorsKeisuke Yoshida, Futoshi Yurugi
Estimating the term…
An X-ray inspection apparatus includes a transport unit configured to transport an article, an electromagnetic wave irradiation unit configured to irradiate the article with a first electromagnetic wave in a first energy band and a second electromagnetic wave in a second energy band, an electromagnetic wave sensor configured to detect the first electromagnetic wave and the second electromagnetic wave, and a control unit to which a detection result is input. The control unit is configured to generate a first transmission image based on a detection result of the first electromagnetic wave and a second transmission image based on a detection result of the second electromagnetic wave, to perform image processing including a subtraction process on the first transmission image and the second transmission image, and to determine whether or not a foreign material is included in the article on the basis of a difference image.
An X-ray inspection apparatus comprising:
An X-ray inspection system comprising:
An X-ray inspection method comprising:
Dependencies are inferred from the claim text.