Measuring device and selection device

A measurement apparatus for measuring a condition of a target, the measurement apparatus comprising:

• a conveyance portion configured to convey the target;
• an electromagnetic wave irradiation source configured to irradiate the target in transit due to an action of the conveyance portion with an electromagnetic wave;
• a sensor configured to detect at least one of a reflected electromagnetic wave emitted from the electromagnetic wave irradiation source and reflected on the target and a transmitted electromagnetic wave emitted from the electromagnetic wave irradiation source and transmitted through the target;
• a discrimination portion configured to discriminate the condition of the target based on a signal acquired by the sensor;
• and
• an irradiation control portion configured to control the irradiation with the electromagnetic wave emitted from the electromagnetic wave irradiation source,
• wherein the electromagnetic wave irradiation source includes a first irradiation source and a second irradiation source different from each other in at least one of a wavelength range of the electromagnetic wave emitted therefrom and an installation position thereof,
• the irradiation control portion is configured to control the electromagnetic wave irradiation source in such a manner that a first irradiation period and a second irradiation period do not overlap each other and occur alternately, the first irradiation period being a period during which the first irradiation source emits the electromagnetic wave, the second irradiation period being a period during which the second irradiation source emits the electromagnetic wave,
• at least one of the first irradiation source and the second irradiation source is configured to emit at least an electromagnetic wave in a first wavelength range and an electromagnetic wave in a second wavelength range different from the first wavelength range,
• the sensor includes an element sensitive to both the first wavelength range and the second wavelength range,
• the measurement apparatus includes
• a correction portion configured to make a correction for reducing an intensity of a signal acquired by the element, and
• a reception portion configured to receive a kind of the target that should be measured by the measurement apparatus,
• the discrimination portion discriminates the condition of the target based on the intensity of the signal after the correction, and
• the correction portion is configured to change a level of the correction according to the kind of the target received by the reception portion.

A measurement apparatus for measuring a condition of a target, the measurement apparatus comprising:

• a conveyance portion configured to convey the target;
• an electromagnetic wave irradiation source configured to irradiate the target in transit due to an action of the conveyance portion with an electromagnetic wave;
• a sensor configured to detect at least one of a reflected electromagnetic wave emitted from the electromagnetic wave irradiation source and reflected on the target and a transmitted electromagnetic wave emitted from the electromagnetic wave irradiation source and transmitted through the target;
• a discrimination portion configured to discriminate the condition of the target based on a signal acquired by the sensor;
• and
• an irradiation control portion configured to control the irradiation with the electromagnetic wave emitted from the electromagnetic wave irradiation source,
• wherein the electromagnetic wave irradiation source includes a first irradiation source and a second irradiation source different from each other in at least one of a wavelength range of the electromagnetic wave emitted therefrom and an installation position thereof,
• the irradiation control portion is configured to control the electromagnetic wave irradiation source in such a manner that a first irradiation period and a second irradiation period do not overlap each other and occur alternately, the first irradiation period being a period during which the first irradiation source emits the electromagnetic wave, the second irradiation period being a period during which the second irradiation source emits the electromagnetic wave,
• at least one of the first irradiation source and the second irradiation source is configured to emit at least an electromagnetic wave in a first wavelength range and an electromagnetic wave in a second wavelength range different from the first wavelength range,
• the sensor includes an element sensitive to both the first wavelength range and the second wavelength range,
• the measurement apparatus includes a correction portion configured to make a correction for reducing an intensity of a signal acquired by the element, and
• the discrimination portion discriminates the condition of the target based on the intensity of the signal after the correction, and
• the correction portion is configured to change the level of the correction according to the intensity of the signal acquired by the element.