Spectrum measurement apparatus and spectrum measurement method

An electronic apparatus, wherein the electronic apparatus comprises a spectrum measurement apparatus, and the spectrum measurement apparatus comprises:

• a plurality of first light emitters, wherein each first light emitter of the plurality of first light emitters is adapted to emit wide-spectrum light having a first emission spectrum in a first band range, wherein the wide-spectrum light comprises a plurality of light waves of different wavelengths within the first band range, two first emission spectrums emitted by any two first light emitters are not correlated, and wherein the plurality of first light emitters are capable of being operated to emit light having corresponding first emission spectrums to a to-be-measured object in a time-division manner;
• a first single-point photodetector adapted to separately detect a light intensity of light that is emitted by each first light emitter of the plurality of first light emitters and that is reflected by the to-be-measured object;
• and
• a calculation apparatus adapted to determine a first reflectivity spectrum of the to-be-measured object in the first band range based on the first emission spectrums emitted by the plurality of first light emitters and the detected corresponding light intensities.

A method, comprising:

• enabling a plurality of first light emitters to emit light of first emission spectrums in a first band range to a to-be-measured object in a time-division manner, wherein each first light emitter of the plurality of first light emitters is adapted to emit wide-spectrum light comprising a plurality of light waves of different wavelengths within the first band range, and two first emission spectrums emitted by any two first light emitters of the plurality of first light emitters are not correlated;
• detecting, by using a first single-point photodetector, a light intensity of light that is emitted by each first light emitter of the plurality of first light emitters and that is reflected by the to-be-measured object;
• and
• determining a first reflectivity spectrum of the to-be-measured object in the first band range based on the first emission spectrums and the detected corresponding light intensities.