Optical system for reference switching

A system for determining properties of a sample, the system comprising:

• one or more light sources that emit light;
• a detector array comprising detector pixels;
• a window;
• an optics unit mechanically supported by the window and comprising:
• a first substrate;
• and
• a plurality of collection optics on the first substrate;
• and
• an aperture layer positioned above the optics unit;
• wherein:
• light emitted from the one or more light sources is directed toward the sample through the window;
• the plurality of collection optics receive at least a portion of the light that is returned from the sample through the window and the aperture layer;
• and
• each optic of the plurality of collection optics transmits a portion of the light to a respective detector pixel of the detector array.

A method for determining properties of a sample, comprising:

• emitting light using one or more light sources;
• directing the light toward the sample through a window;
• receiving at least a portion of a return of the light through the window at an optics unit, the optics unit mechanically supported by the window and comprising:
• a first substrate;
• a plurality of collection optics disposed on the first substrate;
• redirecting the light using the plurality of collection optics and towards a detector array comprising director pixels;
• and
• detecting light using the detector array, wherein:
• each optic of the plurality of collection optics transmits a portion of the light to a respective plurality of detector pixels of the detector array.