Measuring instrument
AssigneeHitachi, Ltd.
InventorsMasahiro Masunaga, Ryo Kuwana, Shinji Nomoto, Isao Hara
Life of this patent
Estimating the term…
Abstract
The measuring instrument includes a sensor unit that measures a predetermined physical quantity; an amplifier circuit that amplifies a signal output from the sensor unit; and a linear power supply that supplies power to the amplifier circuit, in which the amplifier circuit includes a first amplifier having a first transistor using a SiC semiconductor, the linear power supply includes a second amplifier having a second transistor using the SiC semiconductor, and noise characteristics of the first amplifier are superior to noise characteristics of the second amplifier.
Claims8
A measuring instrument comprising:
- a sensor unit that measures a predetermined physical quantity;
- an amplifier circuit that amplifies a signal output from the sensor unit;
- and
- a linear power supply that supplies power to the amplifier circuit, wherein
- the amplifier circuit includes a plurality of first amplifiers each having a first transistor using a SiC semiconductor,
- the linear power supply includes a plurality of second amplifiers each having a second transistor using a SiC semiconductor, and
- a noise amount of at least one of the plurality of first amplifiers is smaller than the noise amount of any of the plurality of second amplifiers.
Dependencies are inferred from the claim text.