Structure for particle acceleration and charged particle beam apparatus
AssigneeHitachi High-Tech Corporation
InventorsRyo Sugiyama, Kenji Tanimoto, Shuhei Ishikawa
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AssigneeHitachi High-Tech Corporation
InventorsRyo Sugiyama, Kenji Tanimoto, Shuhei Ishikawa
Estimating the term…
Provided are a structure for particle acceleration and a charged particle beam apparatus, which enable the suppression of electric field concentration occurring near a negative electrode part. The structure for particle acceleration includes: a ceramic body 1 having a through hole 10 formed by an inner wall surface; and a negative electrode 2 and a positive electrode 3 which are arranged, respectively, on one end and the other end of the through hole 10 in the ceramic body. The inner wall surface of the ceramic body 1 is configured such that a first region 22, which is electrically connected with the negative electrode 2, and a second region 23, which is electrically connected with the positive electrode 3, are electrically connected to each other. The surface resistivity of the first region 22 is lower than the surface resistivity of the second region 23.
A structure for particle acceleration comprising:
Dependencies are inferred from the claim text.