Framework for selecting thresholds for anomaly detection models and generating quantitative explanations
AssigneeDell Products L.P.
InventorsAdriana Bechara Prado, Alexander Eulalio Robles Robles, Eduarda Tatiane Caetano Chagas, Helen Cristina de Mattos Senefonte, Jonathan Mendes De Almeida, Karen Stéfany Martins
Life of this patent
Estimating the term…