Electrical methods for structural defect detection in battery cells
AssigneeNational Instruments Corporation
InventorsBrian Clifford MacCleery, Martin Weiss
Life of this patent
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Abstract
Systems, methods, and devices for characterizing a defect of a device-under-test (DUT). A first measurement is performed of a first quantity on the DUT prior to performing a first operation on the DUT, producing a first result. The first operation is performed on the DUT, and subsequently a second measurement of the first quantity is performed on the DUT, producing a second result. A defect class is characterized for the DUT from a plurality of defect classes based on a difference between the first and second results.
Claims20
A method for characterizing a defect of a device-under-test (DUT), the method comprising:
- performing a first measurement of a first quantity on the DUT prior to performing a first operation on the DUT, wherein performing the first measurement produces a first result;
- performing the first operation on the DUT;
- after performing the first operation on the DUT, performing a second measurement of the first quantity on the DUT, wherein performing the second measurement produces a second result;
- characterizing a first defect class for the DUT from a plurality of defect classes based at least in part on a difference between the first and second results, wherein the plurality of defect classes comprise defects in different regions of the DUT.
A controller, comprising:
- a non-transitory computer-readable memory medium;
- and
- a processor coupled to memory medium, wherein the processor is configured to execute program instructions stored on the memory medium to cause the controller to:
- perform a first measurement of a first quantity on a device-under-test (DUT) prior to performing a first operation on the DUT, wherein performing the first measurement produces a first result;
- perform the first operation on the DUT;
- after performing the first operation on the DUT, perform a second measurement of the first quantity on the DUT, wherein performing the second measurement produces a second result;
- and
- characterize a first defect class for the DUT from a plurality of defect classes based at least in part on a difference between the first and second results, wherein the plurality of defect classes comprise defects in different regions of the DUT.
A non-transitory computer-readable memory medium storing program instructions which, when executed by at least one processor, cause the at least one processor to:
- perform a first measurement of a first quantity on a device-under-test (DUT) prior to performing a first operation on the DUT, wherein performing the first measurement produces a first result;
- perform the first operation on the DUT;
- after performing the first operation on the DUT, perform a second measurement of the first quantity on the DUT, wherein performing the second measurement produces a second result;
- and
- characterize a first defect class for the DUT from a plurality of defect classes based at least in part on a difference between the first and second results, wherein the plurality of defect classes comprise defects in different regions of the DUT.
Dependencies are inferred from the claim text.