Semiconductor testing device and method of operating the same

A method, comprising:

• forming, over a first portion of a substrate corresponding to a first die, a first device for testing;
• forming, over a second portion of the substrate corresponding to a second die, a second device for testing;
• forming a testing module over the substrate;
• forming a redistribution layer (RDL) over the first device and the second device,
• wherein the RDL connects the first device and the second device in series with the testing module;
• performing a test on the first die and the second die using the testing module, the first device, and the second device;
• and
• forming one or more pads over the first die and the second die using a result of the test.

A method, comprising:

• forming, over a substrate of a plurality of dies, a plurality of devices for testing,
• wherein each of the plurality of dies is associated with a corresponding device of the plurality of devices;
• forming a redistribution layer (RDL) over the substrate,
• wherein the RDL connects the plurality of devices in series for testing;
• performing a test on the plurality of dies using the plurality of devices;
• removing the RDL after performing the test;
• and
• forming one or more pads over the plurality of dies using a result of the test.