Source measure device
AssigneeChroma Ate Inc.
InventorsJyun-Yi Su, Sheng-Shiuan Jian, Ting-Ting Chang, Wen-Yue Chuang
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AssigneeChroma Ate Inc.
InventorsJyun-Yi Su, Sheng-Shiuan Jian, Ting-Ting Chang, Wen-Yue Chuang
Estimating the term…
A source measure device includes a current sampling circuit, a voltage sampling circuit, an overvoltage detecting circuit, and a comparing circuit. The current sampling circuit is configured to sample a current of a device under test. The voltage sampling circuit is configured to sample a voltage of the device under test. The overvoltage detecting circuit is coupled to the current sampling circuit and the voltage sampling circuit, and receives a first operation voltage of the current sampling circuit and a second operation voltage of the voltage sampling circuit so as to generate a detection voltage. The comparing circuit is coupled to the overvoltage detecting circuit, and determines whether the detection voltage is within a voltage range. If the detection voltage is not within the voltage range, the comparing circuit generates an abnormal signal.
A source measure device, comprising:
Dependencies are inferred from the claim text.