Method for evaluation of a thin-layer chromatography plate
AssigneeMerck Patent GmbH
InventorsMichaela Oberle, Eric Schunda, Robert Fischer
Life of this patent
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AssigneeMerck Patent GmbH
InventorsMichaela Oberle, Eric Schunda, Robert Fischer
Estimating the term…
A method for evaluation of a thin-layer chromatography plate after performing a separation process that separates components of a sample on the thin-layer chromatography plate comprises a digitization step, wherein at least two digital images are taken that differ with respect to the wavelength range of illumination of the thin-layer chromatography plate. The method further comprises a position identification step wherein the position of the thin-layer chromatography plate is identified for each of the at least two digital images. Furthermore, the method comprises an evaluation step wherein an image information of the at least two digital images is superimposed for at least all regions with at least one visible spot within at least one of the at least two digital images, so that the superimposition of image information from identical regions of at least two digital images can be used for evaluation of the thin-layer chromatography.
A method for evaluation of a thin-layer chromatography plate (2) after performing a separation process that separates components of a sample on the thin-layer chromatography plate (2), the method comprising:
Dependencies are inferred from the claim text.