Polymer carbon nitride, specific crystal form of said polymer carbon nitride, and ultraviolet ray-blocking use thereof

A cosmetic composition comprising a polymeric carbon nitride (PCN) comprising repeating units represented by the following Formula 1:

• wherein the PCN comprises a crystal form of the PCN selected from the group consisting of crystal forms A to G having the following X-ray powder diffraction patterns as measured using CUKα radiation,
• wherein the X-ray powder diffraction pattern of the crystal form A comprises peaks at one or more diffraction angles selected from the group consisting of 2θ=10.7656±0.2°, 19.8006±0.2° and 29.7456±0.2°, the X-ray powder diffraction pattern of the crystal form B comprises peaks at one or more diffraction angles selected from the group consisting of 2θ=10.7396±0.2° and 29.7456±0.2°, the X-ray powder diffraction pattern of the crystal form C comprises peaks at one or more diffraction angles selected from the group consisting of 2θ=10.7006±0.2°, 22.1406±0.2°, and 27.8606±0.2°, the X-ray powder diffraction pattern of the crystal form D comprises peaks at one or more diffraction angles selected from the group consisting of 2θ=10.6356±0.2° and 27.8216±0.2°, the X-ray powder diffraction pattern of the crystal form E comprises peaks at one or more diffraction angles selected from the group consisting of 2θ=10.7266±0.2° and 27.5096±0.2°, the X-ray powder diffraction pattern of the crystal form F comprises a peak at a diffraction angle of 26=27.1586±0.2, and the X-ray powder diffraction pattern of the crystal form G comprises peaks at one or more diffraction angles selected from the group consisting of 2θ=13.8076±0.2 and 27.1586±0.2,
• wherein, in Formula 1 above, the n is an integer from 1 to 1,000,000.

A composition for UV-blocking comprising a polymeric carbon nitride (PCN) comprising repeating units represented by the following Formula 1:

• wherein the PCN comprises a crystal form of the PCN selected from the group consisting of crystal forms A to G having the following X-ray powder diffraction patterns as measured using CUKα radiation,
• wherein the X-ray powder diffraction pattern of the crystal form A comprises peaks at one or more diffraction angles selected from the group consisting of 2θ=10.7656±0.2°, 19.8006±0.2° and 29.7456±0.2°, the X-ray powder diffraction pattern of the crystal form B comprises peaks at one or more diffraction angles selected from the group consisting of 2θ=10.7396±0.2° and 29.7456±0.2°, the X-ray powder diffraction pattern of the crystal form C comprises peaks at one or more diffraction angles selected from the group consisting of 2θ=10.7006±0.2°, 22.1406±0.2°, and 27.8606±0.2°, the X-ray powder diffraction pattern of the crystal form D comprises peaks at one or more diffraction angles selected from the group consisting of 2θ=10.6356±0.2° and 27.8216±0.2°, the X-ray powder diffraction pattern of the crystal form E comprises peaks at one or more diffraction angles selected from the group consisting of 2θ=10.7266±0.2° and 27.5096±0.2°, the X-ray powder diffraction pattern of the crystal form F comprises a peak at a diffraction angle of 26=27.1586±0.2, and the X-ray powder diffraction pattern of the crystal form G comprises peaks at one or more diffraction angles selected from the group consisting of 20=13.8076±0.2 and 27.1586±0.2,
• wherein, in Formula 1 above, the n is an integer from 1 to 1,000,000.