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US 12,578,382 B2Granted
Automatic test equipment including multiple pin electronics integrated circuits in form of module
AssigneeAdvantest Corporation
InventorsHiroki Ichikawa, Satoshi Sudo, Tasuku Fujibe
Life of this patent
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Abstract
An interface apparatus is provided between a test head and a device under test includes a frontend module configured of multiple pin electronics integrated circuits in the form of a module.
Claims6
An interface apparatus provided between a test head and a device under test (DUT), the interface apparatus comprising a frontend module formed of a plurality of pin electronics ICs (Integrated circuits) in the form of a module,
- wherein the front-end module includes a plurality of printed circuit boards on which the pin electronics ICs are mounted;
- wherein the printed circuit boards are arranged in parallel with a YZ plane, which is perpendicular to a surface of the DUT that lies in an XY plane;
- wherein four of the printed circuit boards are disposed adjacent to one another in a thickness direction of the boards, the thickness direction corresponding to an X-direction that is orthogonal to the DUT surface;
- wherein eight pin electronics ICs are assigned to the DUT, the eight ICs being arranged such that two ICs are mounted in a Y-direction on each of the four printed circuit boards;
- wherein the two pin electronics ICs mounted on each printed circuit board are positioned at locations equidistant from the DUT;
- and wherein the DUT is located at a center of the four printed circuit boards when viewed along the Y-direction,
- wherein the frontend module is configured of divisions comprising a plurality of DUTs that correspond to the N(N≥2) DUTs in the form of a single unit,
- wherein N=4,
- wherein the four DUTs are arranged in a matrix of two rows and two columns,
- and wherein the single unit has a structure in which eight printed circuit boards are stacked.
7 more elements
Dependencies are inferred from the claim text.