Back to results
US 12,578,286 B2Granted
Multichannel LED light to enable photometric stereo for 3D reconstruction
AssigneeUnitX, Inc.
InventorsTommy Liu, Killian Weber, Roman Balak, Hill Ma
Life of this patent
Estimating the term…
Abstract
In an example, a light system is provided that allows for increased reliability in directly detecting defects in components by capturing multiple different images of the component under different lighting conditions and using a photometric stereo technique to reconstruct a three-dimensional (3D) model of the component, which can be used to perform additional operations to increase the reliability of defect detection, such as measuring the height of variations in a surface of the component.
Claims20
A system comprising:
- a lighting apparatus including a plurality of independently controllable light sources and at least one camera;
- and
- a computer system comprising at least one hardware processor and a non-transitory computer-readable medium storing instructions that, when executed by the at least one hardware processor, cause the at least one hardware processor to perform operations comprising:
- accessing a sequence of one or more capture configurations, each of the one or more capture configurations defining multiple image captures by the at least one camera, each image capture having an exposure time and an indication of which single light source of the independently controllable light sources to illuminate during the multiple image captures;
- receiving a plurality of images, of a component, captured during execution of one of the one or more capture configurations of the sequence while the at least one camera remained in a fixed position relative to the component;
- performing a photometric stereo operation on the plurality of images to create a three-dimensional (3D) reconstruction of the component;
- measuring change in depth of a feature of a surface of the component in the 3D reconstruction;
- and
- based on the change in depth of the feature to determine whether the feature is a defect in the component.
6 more elements
A method comprising:
- accessing a sequence of one or more capture configurations, each of the one or more capture configurations defining multiple image captures by at least one camera, each image capture having an exposure time and an indication of which single light source of a plurality of independently controllable light sources to illuminate during the multiple image captures;
- receiving a plurality of images, of a component, captured during execution of one of the one or more capture configurations of the sequence while the at least one camera remained in a fixed position relative to the component;
- performing a photometric stereo operation on the plurality of images to create a three-dimensional (3D) reconstruction of the component;
- measuring change in depth of a feature of a surface of the component in the 3D reconstruction;
- and
- based on the change in depth of the feature to determine whether the feature is a defect in the component.
3 more elements
A non-transitory machine-readable storage medium having embodied thereon instructions executable by one or more machines to perform operations comprising:
- accessing a sequence of one or more capture configurations, each of the one or more capture configurations defining multiple image captures by at least one camera, each image capture having an exposure time and an indication of which single light source of a plurality of independently controllable light sources to illuminate during the multiple image captures;
- receiving a plurality of images, of a component, captured during execution of one of the one or more capture configurations of the sequence while the at least one camera remained in a fixed position relative to the component;
- performing a photometric stereo operation on the plurality of images to create a three-dimensional (3D) reconstruction of the component;
- measuring change in depth of a feature of a surface of the component in the 3D reconstruction;
- and
- based on the change in depth of the feature to determine whether the feature is a defect in the component.
3 more elements
Dependencies are inferred from the claim text.