Method and device for monitoring of a heap of material
AssigneeAxis AB
InventorsThomas Winzell, Ann-Sofie Rase, Jesper Bengtsson, Tuong Lam
Life of this patent
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AssigneeAxis AB
InventorsThomas Winzell, Ann-Sofie Rase, Jesper Bengtsson, Tuong Lam
Estimating the term…
A device for monitoring a heap of material, comprises circuitry for executing a plurality of functions. A region of interest function, in a thermal video stream captured by a thermal video camera, defines a region of interest covering the heap of material. A reference spatial property setting function, from pixels within a video frame of the thermal video stream, determines a spatial property of the heap of material; and sets the determined spatial property as a reference spatial property. A region of interest adjusting function determines a respective sample spatial property for regions in the thermal video stream; and adjusts the region of interest such that regions exhibiting a sample spatial property above a threshold are included by the region of interest. A temperature monitoring function over time and within the region of interest, monitors a temperature measure; and if it exceeds a predetermined threshold, generates an alarm event.
A method for use in a device having processing capabilities for monitoring a heap of material, the method comprising:
A non-transitory computer-readable storage medium having stored thereon instructions for implementing a method, when executed on a device having processing capabilities, the method for monitoring a heap of material, the method comprising:
A device for monitoring a heap of material, the device comprising:
Dependencies are inferred from the claim text.