Single-side polishing apparatus, single-side polishing method, and polishing pad
AssigneeShin-Etsu Handotai Co., Ltd.
InventorsJunichi Ueno, Kaoru Ishii
Life of this patent
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Abstract
A single-side polishing apparatus including: a base turntable having a groove for vacuum suction; a detachable polishing turntable immobilized by vacuum suction; a polishing pad; and a polishing head configured to hold a wafer. The single-side polishing apparatus brings a surface of a wafer held by the polishing head into sliding contact with the polishing pad for polishing. The polishing pad includes a polishing layer configured to polish the wafer surface, a first adhesive layer, a PET sheet layer, a second adhesive layer, an elastic layer, and a third adhesive layer for attachment to the polishing turntable. The layers are sequentially stacked. The polishing pad has a compressibility of 16% or more.
Claims9
A single-side polishing apparatus comprising:
- a base turntable having an upper surface with a groove for vacuum suction;
- a detachable polishing turntable immobilized on the upper surface of the base turntable by vacuum suction;
- a polishing pad attached to the polishing turntable;
- and
- a polishing head configured to hold a wafer, wherein the single-side polishing apparatus is configured to bring a surface of the wafer held by the polishing head into sliding contact with the polishing pad to polish the surface,
- the polishing pad comprises a polishing layer configured to polish the surface of the wafer, a first adhesive layer, a PET sheet layer, a second adhesive layer, an elastic layer, and a third adhesive layer for attachment to the polishing turntable, and the layers are sequentially stacked, and
- the polishing pad has a compressibility value, measured according to standard JIS L-1096, of 16% or more.
A polishing pad configured to polish a surface of a wafer while attached to a polishing turntable of a single-side polishing apparatus, wherein
- the polishing pad comprises a polishing layer configured to polish the surface of the wafer, a first adhesive layer, a PET sheet layer, a second adhesive layer, an elastic layer, and a third adhesive layer for attachment to the polishing turntable, and the layers are sequentially stacked, and
- the polishing pad has a compressibility value, measured according to standard JIS L-1096, of 16% or more.
Dependencies are inferred from the claim text.