Memory device with dual interface, test method and test system thereof

A memory device with dual interface, comprising:

• a flash memory module stored an initialization program;
• and
• a main control module electrically connected to the flash memory module and configured to access the initialization program to execute an initialization procedure, wherein the main control module is configured to:
• executing the initialization procedure in a PCIe mode for the memory device with dual interface;
• and
• altering a voltage of a pin operating in an SD mode of the memory device with dual interface based on the initialization procedure;
• wherein, the voltage level of the pin of the memory device with dual interface is switched between a high voltage level and a low voltage level at a first frequency during a test stage of the initialization procedure and the voltage level of the pin of the memory device with dual interface is maintained at the high voltage level or the low voltage level according to a first test result during a result display stage of the initialization procedure;
• a timing of the test stage of the initialization procedure precedes a timing of the result display stage of the initialization procedure.

A test system for memory device with dual interface, comprising:

• a host, communicating with a memory device with dual interface in a PCIe mode;
• and
• a status display circuit communicating with a pin of the memory device with dual interface for displaying a test stage or a result display stage of the memory device with dual interface,
• wherein, the memory device with dual interface comprising:
• a flash memory module stored an initialization program;
• and
• a main control module electrically connected to the flash memory module and configured to access the initialization program to execute an initialization procedure, wherein the main control module is configured to:
• executing the initialization procedure in the PCIe mode for the memory device with dual interface;
• and
• altering a voltage of the pin operating in an SD mode of the memory device with dual interface based on the initialization procedure;
• wherein, the voltage level of the pin of the memory device with dual interface is switched between a high voltage level and a low voltage level at a first frequency during the test stage of the initialization procedure and the voltage level of the pin of the memory device with dual interface is maintained at the high voltage level or the low voltage level according to a first test result during the result display stage of the initialization procedure;
• a timing of the test stage of the initialization procedure precedes a timing of the result display stage of the initialization procedure.

A test method for memory device with dual interface, comprising:

• executing an initialization procedure with a first interface;
• and
• altering the voltage of a pin of a second interface based on the initialization procedure;
• wherein, the voltage level of the pin of the second interface is switched between a high voltage level and a low voltage level at a first frequency during a test stage of the initialization procedure.

A test system for memory device with dual interface, comprising:

• a host;
• a light-emitting diode;
• a flash memory module stored an initialization program;
• and
• a main control module electrically connected to the flash memory module and configured to access the initialization program to execute an initialization procedure, wherein the main control module communicates with the host through a first interface and is electrically connected with the light-emitting diode through a second interface, and
• wherein, the light-emitting diode flickers at a first frequency by a voltage of a pin of the second interface altered by the main control module during a test stage of the initialization procedure.