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US 12,573,039 B2Granted
Imaging systems and methods useful for patterned structures
AssigneeSingular Genomics Systems, Inc.
InventorsFedor Trintchouk, Eli N. Glezer
Life of this patent
Estimating the term…
Abstract
Disclosed herein, inter alia, are methods and systems of image analysis useful for identifying and/or quantifying features in patterns.
Claims14
A method of imaging a solid support comprising a plurality of features, the method comprising:
- obtaining an image of the solid support using a detection apparatus comprising at least one camera, wherein the solid support comprises a first feature comprising a first fluorescent emission and a second feature comprising a second fluorescent emission;
- providing the image or image-related data to a computer, wherein the computer has parameter data that describes a position of the features;
- and
- executing the following on the computer:
- performing a chromatic correction;
- partitioning the image or the image-related data into a plurality of registration subimages;
- detecting features for each registration subimage;
- assigning an index address for each feature;
- and
- quantifying a signal level of each feature, wherein quantifying the signal level of each feature comprises building a model of the subimage incorporating known feature locations and corresponding unknown intensities and fitting the model to the image of the solid support, and wherein the model of the subimage comprises a matrix that is pre-computed and stored in computer memory or a non-transitory computer-readable medium.
7 more elements
A non-transitory computer-readable medium containing instructions to configure a processor to perform operations comprising:
- obtaining an image of a solid support using a detection apparatus comprising at least one camera, wherein the solid support comprises a first feature comprising a first fluorescent emission and a second feature comprising a second fluorescent emission;
- providing the image or image-related data to a computer, wherein the computer has parameter data that describes a position of the features;
- and
- executing the following on the computer:
- performing a chromatic correction;
- partitioning the image or the image-related data into a plurality of registration subimages;
- detecting features for each registration subimage;
- assigning an index address for each feature;
- and
- quantifying a signal level of each feature, wherein quantifying the signal level of each feature comprises building a model of the subimage incorporating known feature locations and corresponding unknown intensities and fitting the model to the image of the solid support, and wherein the model of the subimage comprises a matrix that is pre-computed and stored in computer memory or a non-transitory computer-readable medium.
7 more elements
A system comprising:
- a processor;
- and
- a memory, wherein the processor and the memory are configured to perform operations comprising:
- obtaining an image of the solid support using a detection apparatus comprising at least one camera, wherein the
- solid support comprises a first feature comprising a first fluorescent emission and a second feature comprising a second fluorescent emission;
- providing the image or image-related data to a computer, wherein the computer has parameter data that describes a position of the features;
- and
- executing the following on the computer:
- performing a chromatic correction;
- partitioning the image or the image-related data into a plurality of registration subimages;
- detecting features for each registration subimage;
- assigning an index address for each feature;
- and
- quantifying a signal level of each feature, wherein quantifying the signal level of each feature comprises building a model of the subimage incorporating known feature locations and corresponding unknown intensities and fitting the model to the image of the solid support, and wherein the model of the subimage comprises a matrix that is pre-computed and stored in computer memory or a non-transitory computer-readable medium.
11 more elements
Dependencies are inferred from the claim text.