General digital signal processing waveform machine learning control application

A test and measurement system, comprising:

• a machine learning system, comprising one or more neural networks;
• a test automation system comprising:
• a user interface configured to allow a user to provide one or more user inputs and to provide results to the user;
• and
• one or more processors, the one or more processors configured to execute code that causes the one or more processors to:
• receive one or more user inputs through the user interface, the one or more user inputs at least identifying a selected machine learning system configuration to be used;
• receive a waveform created by operation of a device under test (DUT);
• send the waveform as an input to the machine learning system having the selected machine learning system configuration;
• receive an output of predicted metadata that includes at least one next tuning parameter for the device under test;
• using the at least one tuning parameter to set parameters for the DUT for a next test;
• and
• performing the next test.