Method of inspecting a sensor
AssigneeSamsung Display Co., Ltd.
InventorsKeeyong Kim, Jun-Young Ko, Eunsol Seo, Junghun Sin, Junseong Lee, Jaewoo Choi
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Abstract
A method of inspecting a sensor including generating a first model based on first big-data including first inspection results for sensors of a same type connected to a current inspection environment, generating first target characteristic coefficients for channels included in the first model, generating first characteristic coefficients for channels included in a current sensor, and generating first compensation coefficients for the channels included in the current sensor based on the first target characteristic coefficients and the first characteristic coefficients.
Claims15
A method of inspecting a sensor, the method comprising:
- providing a current inspection environment comprising an inspection jig and a test integrated circuit to inspect sensor defects, the current inspection environment connectable to the sensors, the test integrated circuit receiving sensing values from the sensors through the inspection jig, wherein sensing values for nodes near an edge of the sensor are lower than sensing values for nodes near a center of the sensor;
- generating a first model based on first data including first inspection results for sensors of a same type connected to the current inspection environment, the first data comprising the sensing values;
- generating first target characteristic coefficients for channels included in the first model;
- generating first characteristic coefficients for channels included in a current sensor;
- and
- generating first compensation coefficients for the channels included in the current sensor based on the first target characteristic coefficients and the first characteristic coefficients;
- generating a node compensation map based on the first compensation coefficients and a size of each of the nodes included in the current sensor and compensating for sensing values for nodes included in the current sensor based on the node compensation map;
- and
- masking the first model based on redesigning the sensors of the same type.
A method of inspecting a sensor, the method comprising:
- providing an inspection environment comprising an inspection jig and a test integrated circuit to inspect sensor defects, the inspection environment being connectable to the sensor, the test integrated circuit receiving the pre-sensed values from the sensor through the inspection jig, wherein sensing values for nodes near an edge of the sensor are lower than sensing values for nodes near a center of the sensor;
- generating a first model based on pre-sensed values for nodes included in the sensor, the pre-sensed values being measured by repeating operations of connecting the sensor to the inspection environment;
- generating first target characteristic coefficients for channels included in the first model;
- generating first characteristic coefficients for channels included in the sensor;
- generating first compensation coefficients for the channels included in the sensor based on the first target characteristic coefficients and the first characteristic coefficients;
- and
- generating a node compensation map based on the first compensation coefficients and a size of each of the nodes included in the current sensor and compensating for sensing values for nodes included in the current sensor based on the node compensation map.
Dependencies are inferred from the claim text.