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US 12,571,837 B2Granted
Semiconductor device with a protective diode connected to a fuse
AssigneeInternational Business Machines Corporation
InventorsHuimei Zhou, Yuncheng Song, Terence Hook, Miaomiao Wang
Life of this patent
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Abstract
A semiconductor device includes a device under test, and a protection circuit electrically connected to the device under test, the protection circuit including: a protective diode, and a laser fuse configured to, upon receiving a laser pulse via an opening, break an electrical path of the protective diode and he device under test.
Claims20
A semiconductor device, comprising:
- a device under test;
- and
- a protection circuit electrically connected to the device under test, the protection circuit comprising:
- a protective diode;
- and
- a laser fuse configured to, upon receiving a laser pulse via an opening, break an electrical path of the protective diode and the device under test.
3 more elements
A method for protecting a device under test, the method comprising:
- forming the device under test;
- and
- forming a protection circuit electrically connected to the device under test, wherein forming the protection circuit comprises:
- forming a protective diode;
- and
- forming a laser fuse to, upon receiving a laser pulse via an opening, break an electrical path of the protective diode and the device under test.
3 more elements
An integrated circuit, comprising:
- a device;
- and
- a protection circuit electrically connected to the device, the protection circuit comprising:
- a protective diode;
- and
- a laser fuse configured to, upon receiving a laser pulse via an opening, break an electrical path of the protective diode and the device.
3 more elements
Dependencies are inferred from the claim text.