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US 12,569,917 B2Granted
Cutting tool
AssigneeSumitomo Electric Industries, Ltd.
InventorsSatoshi Ono, Anongsack Paseuth, Katsumi Okamura
Life of this patent
Estimating the term…
Abstract
A cutting tool comprising a base material and a coating disposed on the base material, wherein the coating comprises a hard particle layer; the hard particle layer is formed from a plurality of hard particles including titanium, silicon, carbon, and nitrogen; in the hard particles, a concentration of the silicon periodically changes along a first direction set in the hard particles; and an orientation of the hard particle layer is a (311) orientation.
Claims15
A cutting tool comprising a base material and a coating disposed on the base material, wherein
- the coating comprises a hard particle layer,
- the hard particle layer is formed from a plurality of hard particles including titanium, silicon, carbon, and nitrogen,
- in the hard particles, a concentration of the silicon periodically changes along a first direction set in the hard particles,
- an orientation of the hard particle layer is a (311) orientation, and the orientation of the hard particle layer that is the (311) orientation means that an orientation index TC(311) of a (311) plane in the hard particle layer among an orientation index TC(hkl) defined by an expression (1)
- T
-
- C
-
- (
- hk
-
- 1
- )
- =
- I
-
- (
- hk
-
- 1
- )
- I
- 0
- (
- hk
-
- 1
- )
-
- {
- 1
- 8
- ∑
- x
- ,
- y
- ,
- z
- I
-
- (
- h
- x
-
- k
- y
-
- 1
- z
- )
- I
- 0
- (
- h
- x
-
- k
- y
-
- 1
- z
- )
- }
- -
- 1
- (
- 1
- )
- is larger than respective orientation indices of a (111) plane, a (200) plane, a (220) plane, a (422) plane, a (331) plane, a (420) plane, and a (511) plane, where I(hkl) and I(hxkylz) represent a measured diffraction intensity of a (hkl) plane and a measured diffraction intensity of a (hxkylz) plane, respectively, I0(hkl) and I0(hxkylz) represent an average value of a powder diffraction intensity of TiC (card number:
- 32-1383) and TiN (card number:
- 38-1420) of the (hkl) plane according to JCPDS (Joint Committee on Powder Diffraction Standards) database and an average value of a powder diffraction intensity of TiC and TiN of the (hxkylz) plane according to the JCPDS database, respectively, and (hkl) and (hxkylz) each represent any of 8 planes of the (111) plane the (200) plane, the (220) plane, the (311) plane, the (331) plane, the (420) plane, the (422) plane, and the (511) plane.
68 more elements
Dependencies are inferred from the claim text.