Guardbands in substrate processing systems
AssigneeApplied Materials, Inc.
InventorsJimmy Iskandar, Fei Li, James Robert Moyne
Life of this patent
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AssigneeApplied Materials, Inc.
InventorsJimmy Iskandar, Fei Li, James Robert Moyne
Estimating the term…
A method includes identifying trace data including a plurality of data points, the trace data being associated with production, via a substrate processing system, of substrates having property values that meet threshold values. The method further includes determining, based on a guardband, guardband violation data points of the plurality of data points of the trace data. The method further includes determining, based on the guardband violation data points, guardband violation shape characterization. Classification of additional guardband violation data points of additional trace data is to be based on the guardband violation shape characterization. Performance of a corrective action associated with the substrate processing system is based on the classification.
A method comprising:
A method comprising:
A non-transitory computer-readable storage medium storing instructions which, when executed, cause a processing device to perform operations comprising:
Dependencies are inferred from the claim text.