Measuring method for optical nonlinearity of two-dimensional material
AssigneeNTT, Inc.
InventorsYuya Yonezu, Atsushi Ishizawa, Hidetaka Nishi, Tai Tsuchizawa, Nobuyuki Matsuda, Rai Takahashi, Koji Yamada
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AssigneeNTT, Inc.
InventorsYuya Yonezu, Atsushi Ishizawa, Hidetaka Nishi, Tai Tsuchizawa, Nobuyuki Matsuda, Rai Takahashi, Koji Yamada
Estimating the term…
An optical nonlinearity measurement method according to the present disclosure utilizes photon pair generation through a spontaneous four-wave mixing process, to observe photon pairs using an optical waveguide loaded with a two-dimensional material. Compared with the Z-scan method, the influence of free carriers on nonlinear refractive indexes is only indirect. With a parameter being the length of the attached two-dimensional material in the optical waveguide direction, a theoretical value of the coincidence rate of the photon pairs based on the coupled wave equation is fitted to a measured value of the coincidence rate of the photon pairs. For the coincidence rate of the photon pairs, the theoretical value based on the coupled wave equation is fitted to the measured value in a state reflecting the structure of the optical waveguide loaded with the two-dimensional material, and nonlinear coefficients γ1 and γ2 at that time are obtained.
A method for measuring nonlinear optical properties of a two-dimensional material comprising graphene, the method comprising:
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