System and method for testing an integrity of a face seal in an electrical system

A method of testing an integrity of a conductive gasket that is located within a perimeter groove formed around a top perimeter edge of a nonconductive enclosure and covered by a nonconductive lid, the method comprising:

• positioning a needle of a first probe within a first notch formed in an outer groove wall of the enclosure;
• positioning a needle of a second probe within a second notch formed in the outer groove wall of the nonconductive enclosure, wherein the second notch is spaced apart from the first notch so that conductive fasteners that secure the nonconductive lid to the nonconductive enclosure are between the first and second notches;
• injecting an input current into the first probe;
• comparing an input voltage from the first probe in the first notch with an output voltage that is induced in the conductive fasteners and transferred to the second probe in the second notch to determine that a difference in the voltages is within a predetermined range, where voltage in the conductive fasteners is measured with another probe.

A system comprising:

• a probe, comprising:
• a probe shaft having:
• a base;
• a needle extending in a first direction from the base to a first outer end;
• a top shaft extending in a second direction from the base to a second outer end, the second direction being opposite the first direction;
• a probe wire connected to the second outer end;
• a lock member surrounding a first portion of the probe shaft located near the second outer end;
• a sliding grip surrounding a second portion of the probe shaft that is located adjacent to the first portion of the probe shaft;
• a spring extending between the base and the sliding grip,
• wherein, pressing the sliding grip toward the base, compresses the spring and urges the base and the needle in the first direction,
• wherein the probe is a first probe;
• an electronics unit, including:
• a nonconductive enclosure defining a cavity and having a top that provides access to the cavity, the top of the nonconductive enclosure having a top perimeter edge that defines a perimeter groove having an outer groove wall and an inner groove wall;
• a conductive gasket disposed in the perimeter groove;
• a nonconductive lid disposed against the top of the nonconductive enclosure to enclose the cavity and the perimeter groove;
• conductive fasteners securing the nonconductive lid to the nonconductive enclosure, wherein the conductive fasteners are near the conductive gasket;
• a first notch defined in the outer groove wall, the first notch is sized to receive the needle of the first probe.