Capacitor test
AssigneeMicron Technology, Inc.
InventorMarco Redaelli
Life of this patent
Estimating the term…
Abstract
Implementations described herein relate to a capacitor test. In some implementations, a system may include a memory device, one or more capacitors located externally to the memory device, and one or more components configured to initiate a capacitor test for the one or more capacitors. The one or more components may be configured to perform an iteration of the capacitor test for the one or more capacitors, wherein performing the iteration of the capacitor test comprises waiting a time period, increasing a discharge time, reading a counter associated with the capacitor test, and determining whether a value of the counter has increased. The one or more components may be configured to perform another iteration of the capacitor test or terminate the capacitor test based on determining whether the value of the counter has increased.
Claims20
A system, comprising:
- a memory device;
- one or more capacitors located externally to the memory device;
- and
- one or more components configured to:
- initiate a capacitor test for the one or more capacitors;
- perform an iteration of the capacitor test for the one or more capacitors, wherein performing the iteration of the capacitor test comprises:
- waiting a time period;
- increasing a discharge time;
- reading a counter associated with the capacitor test;
- and
- determining whether a value of the counter has increased;
- and
- perform another iteration of the capacitor test or terminate the capacitor test based on determining whether the value of the counter has increased.
A system, comprising:
- a ball-grid array (BGA) device;
- and
- one or more components configured to:
- initiate a capacitor test for one or more capacitors;
- perform an iteration of the capacitor test for the one or more capacitors, wherein performing the iteration of the capacitor test comprises:
- waiting a time period;
- increasing a discharge time;
- reading a counter associated with the capacitor test;
- and
- determining whether a value of the counter has increased;
- and
- perform another iteration of the capacitor test or terminate the capacitor test based on determining whether the value of the counter has increased.
A system, comprising:
- a memory device;
- and
- one or more components configured to:
- initiate a capacitor test for one or more capacitors while the memory device is connected to the system;
- perform an iteration of the capacitor test for the one or more capacitors, wherein performing the iteration of the capacitor test comprises:
- waiting a time period;
- increasing a discharge time;
- reading a counter associated with the capacitor test;
- and
- determining whether a value of the counter has increased;
- and
- perform another iteration of the capacitor test or terminate the capacitor test based on determining whether the value of the counter has increased.
Dependencies are inferred from the claim text.