Mineralogical analysis system of copper concentrate
AssigneeCodelcotec SPA
InventorsLeonel Contreras Rojas, Víctor Duarte Olave, Eduardo Rodríguez Seguel, Patricio Lara Torres
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Abstract
This invention patent application addresses a system for the detection and quantification of mineralogical species via x-ray diffraction (XRD) of the concentrate of dry copper before it is injected into a converter or melting furnace. Specifically, it addresses a device that performs a mineralogical analysis, in line and in real time, of the concentrate of copper in the bath smelting furnace via x-ray diffraction (XRD), which allows for control over the ideal mixture for the optimal process for copper sulfide (Cu2S)-white metal, iron sulfide (FeS)-Slag and pyritic sulfur (S2)-temperature.
Claims7
A system for detection and quantification of mineralogical species via x-ray diffraction (XRD) of a concentrate of dry copper before injection of the concentrate of dry copper into a converter or melting furnace, the system comprising:
- an injection tube adapted to inject dry copper concentrate into a bath smelting furnace;
- an inlet bypass having a first end and a second end, the first end located in the injection tube, the inlet bypass adapted to divert a sample of the dry copper concentrate from the injection tube;
- an x-ray diffraction equipment connected to the second end of the inlet bypass, the x-ray diffraction equipment adapted to receive the sample of the dry copper concentrate, perform x-ray diffraction on the sample, and perform a mineralogical analysis of the sample;
- a return bypass having a third end connected to the x-ray diffraction equipment and a fourth end connected to the injection tube, the return bypass adapted to allow the sample of the dry copper concentrate from the x-ray diffractor to return to an injection flow in the injection tube towards the bath smelting furnace,
- wherein a volume (VE) of the sample exposed to X-rays is determined according to a relationship as follows:
- V
- E
- =
- π
-
- h
-
- (
- a
- -
- b
- )
- 2
- 4
- ,
- wherein:
- VE is a volume of the sample exposed to X-rays;
- a is an outer diameter of the sample in the sample holder;
- b is an inner diameter of the sample in the sample holder;
- and
- h is a thickness of the sample,
- wherein the x-ray diffraction equipment comprises a curved sensor, and
- wherein the system is further adapted to divert and perform a mineralogical analysis of a plurality of samples of the dry copper concentrate, wherein the system is adapted to perform a first diversion of a first sample from the injection tube and a second inversion of a second sample from the injection tube with a time between the first and second diversions being between 5-20 minutes.
A system for detection and quantification of mineralogical species via x-ray diffraction (XRD) of a concentrate of dry copper before injection of the concentrate of dry copper into a converter or melting furnace, the system comprising:
- an injection tube that injects dry copper concentrate into a bath smelting furnace;
- an inlet bypass having a first end and a second end, the first end located in the injection tube, the inlet bypass adapted to divert a sample of the dry copper concentrate from the injection tube;
- an x-ray diffraction equipment connected to the second end of the inlet bypass, the x-ray diffraction equipment adapted to receive the sample, perform x-ray diffraction on the sample, and perform a mineralogical analysis of the sample;
- a return bypass having a third end connected to the x-ray diffraction equipment and a fourth end connected to the injection tube, the return bypass adapted to allow the sample from the x-ray diffractor to return to an injection flow in the injection tube towards the bath smelting furnace, wherein a volume (VE) of the sample exposed to X-rays is determined according to a relationship as follows:
- V
- E
- =
- π
-
- h
-
- (
- a
- -
- b
- )
- 2
- 4
- ,
- wherein:
- VE is a volume of the sample exposed to X-rays;
- a is an outer diameter of the sample in the sample holder;
- b is an inner diameter of the sample in the sample holder;
- and
- h is a thickness of the sample,
- wherein the x-ray diffraction equipment comprises a sensor comprising a goniometer for controlling movements of detector and source as well as sweep time and angle steps.
Dependencies are inferred from the claim text.