Facility for detecting at least one characteristic parameter of a medium, and method for detecting at least one such characteristic parameter
AssigneesCentralesupelec, Universite De Lorraine
InventorsPatrick Perre, Ninel Kokanyan, Cédric Guérin, Mahamadou Mounkaila, Emilie Michiels, Victor Pozzobon
Life of this patent
Estimating the term…