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US 12,565,485 B2Granted
Solid forms of 1-((S)-4-((R)-7-(6-amino-4-methyl-3-(trifluoromethyl)pyridin-2-yl)-6-chloro-8-fluoro-2-(((s)-1-methylpyrrolidin-2-yl)methoxy)quinazolin-4-yl)-3-methylpiperazin-1-yl)prop-2-en-1-one
AssigneeGenentech, Inc.
InventorAntonio Giovanni Dipasquale
Life of this patent
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Abstract
Provided herein are salts and solid forms of 1-((S)-4-((R)-7-(6-amino-4-methyl-3-(trifluoromethyl)pyridin-2-yl)-6-chloro-8-fluoro-2-(((S)-1-methylpyrrolidin-2-yl)methoxy)quinazolin-4-yl)-3-methylpiperazin-1-yl)prop-2-en-1-one, including adipate, fumarate, ethylenesulphonate, besylate, and mesylate salts thereof.
Claims40
A crystal form comprising Compound A, Form A:
- having an X-ray powder diffraction pattern comprising characteristic X-ray powder diffraction peaks using CuKα radiation at 9.6474, 11.0365, 15.4059, 16.4193, and 18.7038 (±0.1° 2θ).
A crystal form comprising Compound A, Form B:
- having an X-ray powder diffraction pattern comprising characteristic X-ray powder diffraction peaks using CuKα radiation at 5.2063, 14.63, 17.7161, 21.9253, and 25.1335 (±0.1° 2θ).
A crystal form comprising Compound A, Form D:
- having an X-ray powder diffraction pattern comprising characteristic X-ray powder diffraction peaks using CuKα radiation at 9.7745, 11.0487, 15.2452, 18.6477, and 18.7908 (±0.1°2θ).
A crystal form comprising Compound B:
- having an X-ray powder diffraction pattern comprising characteristic X-ray powder diffraction peaks using CuKα radiation at 6.6796, 14.9097, 15.2963, 19.4416, and 23.7124 (±0.1°2θ).
A crystal form comprising Compound C:
- having an X-ray powder diffraction pattern comprising characteristic X-ray powder diffraction peaks using CuKα radiation at 12.5401, 17.5707, 16.834, 21.3525, and 26.5569 (±0.1°2θ).
A crystal form comprising Compound D:
- having an X-ray powder diffraction pattern comprising characteristic X-ray powder diffraction peaks using CuKα radiation at 7.3809, 10.7407, 14.654, 18.5979, and 25.2558 (±0.1° 2θ).
A crystal form comprising Compound E:
- having an X-ray powder diffraction pattern comprising characteristic X-ray powder diffraction peaks using CuKα radiation at 5.9702, 6.2798, 12.4314, 18.9264, and 20.6365 (±0.1° 2θ).
Dependencies are inferred from the claim text.