Method for manufacturing semiconductor device
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsShunpei Yamazaki, Masami Jintyou, Yukinori Shima
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Abstract
Provided is a method for manufacturing a semiconductor device whose electric characteristics are prevented from being varied and whose reliability is improved. In the method, an insulating film is formed over an oxide semiconductor film, a buffer film is formed over the insulating film, oxygen is added to the buffer film and the insulating film, a conductive film is formed over the buffer film to which oxygen is added, and an impurity element is added to the oxide semiconductor film using the conductive film as a mask. An insulating film containing hydrogen and overlapping with the oxide semiconductor film may be formed after the impurity element is added to the oxide semiconductor film.
Claims9
A method for manufacturing a semiconductor device including a transistor comprising steps of:
- forming an oxide semiconductor film comprising indium, gallium, and zinc;
- forming a first insulating film over the oxide semiconductor film;
- forming a first metal oxide film over and in contact with the first insulating film, the first metal oxide film comprising indium or zinc;
- performing a heat treatment after the step of forming the first metal oxide film;
- forming a first conductive film as a gate electrode over the first metal oxide film after performing the heat treatment;
- processing the first insulating film and the first metal oxide film by using the first conductive film as a mask so that a first region and a second region of the oxide semiconductor film are exposed to form a second insulating film as a gate insulating film and a second metal oxide film;
- and
- forming a third insulating film over the first region, the second region, and the first conductive film,
- wherein in a cross-sectional view of the transistor in a channel length direction, end portions of the second insulating film are on a top surface of the oxide semiconductor film,
- wherein in the cross-sectional view, a length of a bottom surface of the first conductive film is smaller than a length of a bottom surface of the second insulating film,
- wherein a side surface of the second insulating film, a side surface of the second metal oxide film, and a side surface of the first conductive film are aligned,
- wherein the second insulating film is in contact with the first region and the second region, and
- wherein the first conductive film overlaps with a third region of the oxide semiconductor film between the first region and the second region through the second metal oxide film and the second insulating film.
A method for manufacturing a semiconductor device including a transistor comprising steps of:
- forming an oxide semiconductor film comprising indium, gallium, and zinc;
- forming a first insulating film over the oxide semiconductor film;
- forming a first metal oxide film over and in contact with the first insulating film, the first metal oxide film comprising indium or zinc;
- adding oxygen to the first metal oxide film and the first insulating film;
- performing a heat treatment after the step of adding oxygen to the first metal oxide film;
- forming a first conductive film as a gate electrode over the first metal oxide film after performing the heat treatment;
- processing the first insulating film and the first metal oxide film by using the first conductive film as a mask so that a first region and a second region of the oxide semiconductor film are exposed to form a second insulating film as a gate insulating film and a second metal oxide film;
- adding an impurity element to the oxide semiconductor film by using the first conductive film as a mask;
- and
- forming a third insulating film over the first region, the second region, and the first conductive film,
- wherein in a cross-sectional view of the transistor in a channel length direction, end portions of the second insulating film are on a top surface of the oxide semiconductor film,
- wherein in the cross-sectional view, a length of a bottom surface of the first conductive film is smaller than a length of a bottom surface of the second insulating film,
- wherein a side surface of the second insulating film, a side surface of the second metal oxide film, and a side surface of the first conductive film are aligned,
- wherein the second insulating film is in contact with the first region and the second region, and
- wherein the first conductive film overlaps with a third region of the oxide semiconductor film between the first region and the second region through the second metal oxide film and the second insulating film.
Dependencies are inferred from the claim text.