Manufacturing methods of display panels and display panels
AssigneeTcl China Star Optoelectronics Technology Co., Ltd.
InventorJiaojiao Shi
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Abstract
A manufacturing method of a display panel includes following steps: forming a semiconductor layer on a substrate, in which the semiconductor layer includes a semiconductor sub-layer and an ohmic contact layer including a first sub-ohmic contact layer and a second sub-ohmic contact layer, and a volume flow rate of phosphine for forming the first sub-ohmic contact layer is greater than or equal to 6590 sccm and less than or equal to 12590 sccm, and a volume flow rate of phosphine for forming the second sub-ohmic contact layer is greater than or equal to 21000 sccm and less than or equal to 27000 sccm.
Claims13
A manufacturing method of a display panel, comprising following steps:
- providing a substrate;
- forming a semiconductor layer on the substrate, wherein the step of forming the semiconductor layer on the substrate comprises:
- forming a semiconductor sub-layer on the substrate, forming a first sub-ohmic contact layer on the semiconductor sub-layer, and forming a second sub-ohmic contact layer on the first sub-ohmic contact layer;
- wherein a volume flow rate of phosphine for forming the first sub-ohmic contact layer is greater than or equal to 6590 sccm and less than or equal to 12590 sccm, and a volume flow rate of phosphine for forming the second sub-ohmic contact layer is greater than or equal to 21000 sccm and less than or equal to 27000 sccm;
- and wherein the first sub-ohmic contact layer and the second sub-ohmic contact layer form an ohmic contact layer with a thickness greater than or equal to 40 Å and less than or equal to 100 Å;
- forming a source/drain metal layer on the semiconductor layer;
- etching the source/drain metal layer to form a source and a drain, and
- etching the semiconductor layer to remove a part of the ohmic contact layer disposed between the source and the drain.
A manufacturing method of a display panel, comprising following steps:
- providing a substrate;
- forming a semiconductor layer on the substrate, wherein the step of forming the semiconductor layer on the substrate comprises:
- forming a semiconductor sub-layer on the substrate, forming a first sub-ohmic contact layer on the semiconductor sub-layer, and forming a second sub-ohmic contact layer on the first sub-ohmic contact layer;
- wherein a volume flow rate of phosphine for forming the first sub-ohmic contact layer is greater than or equal to 6590 sccm and less than or equal to 12590 sccm, and a volume flow rate of phosphine for forming the second sub-ohmic contact layer is greater than or equal to 21000 sccm and less than or equal to 27000 sccm;
- and wherein the first sub-ohmic contact layer and the second sub-ohmic contact layer form an ohmic contact layer with a thickness greater than or equal to 40 Å and less than or equal to 100 Å;
- forming a source/drain metal layer on the semiconductor layer;
- etching the source/drain metal layer to form a source and a drain, and
- etching the semiconductor layer to remove a part of the ohmic contact layer disposed between the source and the drain, wherein a volume flow rate of chlorine in an etching gas for etching the semiconductor layer is less than 400 sccm.
Dependencies are inferred from the claim text.