Display driver circuit and defect testing method

A display driving integrated circuit comprising:

• a source driver configured to generate a plurality of data signals based on a plurality of gamma voltages, the plurality of gamma voltages being generated by a gamma voltage generator;
• a plurality of gamma lines configured to transmit the plurality of gamma voltages to the source driver;
• a plurality of first transistors positioned at a first end of the plurality of gamma lines;
• and
• a plurality of second transistors having different types from the plurality of first transistors, the plurality of second transistors positioned at a second end of the plurality of gamma lines,
• wherein the first end and the second end of the plurality of gamma lines include a front end between the gamma voltage generator and the source driver and a rear end after the source driver.

A method for testing defects of a gamma line sequentially connected to a first transistor, a source driver, and a second transistor comprising:

• applying a first test voltage to the first transistor, the first transistor being connected with a first end of the gamma line;
• applying a second test voltage to the second transistor, the second transistor being connected with a second end of the gamma line, and the first end and the second end of the gamma line including a front end between a gamma voltage generator and the source driver and a rear end after the source driver;
• transmitting an enable signal to a gate of the second transistor;
• transmitting a not-enable signal to a gate of the first transistor, the not-enable signal being an inverted signal of the enable signal;
• obtaining a current value of a current flowing to the gamma line;
• and
• determining that the gamma line has a defect based on the current value.