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US 12,561,936 B2Granted
System and method for occlusion correction
AssigneeCape Analytics, Inc.
InventorsGiacomo Vianello, Peter Lorenzen
Life of this patent
Estimating the term…
Abstract
In variants, the method for occlusion correction can include: determining a measurement depicting an occluded object of interest (OOI), optionally infilling the occluded portion of the object of interest within the measurement, and determining an attribute of the object of interest based on the infilled measurement.
Claims5
A method for analysis of a property, comprising:
- determining a measurement comprising a set of measurement units and depicting a property of interest, wherein the measurement comprises a 3-dimensional (3D) measurement and wherein a measurement unit comprises a voxel;
- determining a property segment depicting a roof from the measurement;
- infilling an occluded portion of the roof with voxel values to yield an updated property segment;
- determining a set of roof parameters, comprising a roof parameter for a subset of measurement units within the updated property segment;
- determining a final roof parameter for the roof based on the set of roof parameters.
2 more elements
Dependencies are inferred from the claim text.