Automatic inspection system and wireless slave device
AssigneeHitachi, Ltd.
InventorsReiso Sasaki, Kazuo Ono
Life of this patent
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AssigneeHitachi, Ltd.
InventorsReiso Sasaki, Kazuo Ono
Estimating the term…
An automatic inspection system includes a wireless slave device and a wireless master device. The wireless slave device includes a sound collection unit that collects sound generated from an inspection target object, an analysis unit that analyzes the collected sound to obtain a degree of difference between the collected sound and normal sound learned in advance and sound state information of the collected sound, as an analysis result, a wireless communication unit that wirelessly transmits data including the analysis results to a wireless master device, and a power supply unit that supplies power to the sound collection unit, the analysis unit, and the wireless communication unit. The wireless master device is configured to perform processing of receiving and managing the data from the wireless slave device, and transmitting the analysis result extracted from the data to a monitoring terminal that monitors a state of the inspection target object.
An automatic inspection system comprising:
A wireless slave device comprising:
Dependencies are inferred from the claim text.