Method, apparatus, and non-transitory computer medium for detecting defects of a device under test using time-domain reflectometry

An apparatus comprising:

• at least one processor;
• and
• a measuring device that measures a device under test using at least one time-domain reflectometry measurement of the device under test to generate a device under test waveform,
• wherein the at least one processor compares the device under test waveform with at least one reference waveform,
• wherein the at least one reference waveform represents at least one time-domain reflectometry measurement of at least one device that is known to satisfy quality standards, and
• wherein the at least one processor determines if the device under test satisfies quality standards based on the result of the comparing the device under test waveform with the at least one reference waveform.

A non-transitory storage medium having stored thereon a program for causing at least one processor to perform:

• measuring, under direction of the at least one processor, a device under test using at least one time-domain reflectometry measurement of the device under test to generate a device under test waveform;
• comparing, using the at least one processor, the device under test waveform with at least one reference waveform, wherein the at least one reference waveform represents at least one time-domain reflectometry measurement of at least one device that is known to satisfy quality standards;
• and
• determining, using the at least one processor, if the device under test satisfies quality standards based on the result of the comparing.