Optical system comprising ans optical multiplexer
AssigneeX-Rite Europe GmbH
InventorPeter Ehbets
Life of this patent
Estimating the term…
Abstract
An optical system (230) comprises an image sensor (231), a reference sensor (232), and an optical multiplexer (300). The optical multiplexer defines a first area for receiving a first portion of incoming light and a second area (320) for receiving a second portion of the incoming light. The second area radially surrounds the first area. The optical multiplexer is arranged to direct the first portion of the incoming light to the image sensor (231) and the second portion of the incoming light to the reference sensor (232). The optical multiplexer may take the form of a pinhole minor (300).
Claims20
An optical system comprising:
- a spatially resolving image sensor, the image sensor defining an image sensor plane, the optical system being configured to image a measurement plane onto the image sensor plane, the optical system defining an optical axis (A) between the measurement plane and the image sensor plane;
- a reference sensor;
- and
- an optical multiplexer configured to receive incoming light along the optical axis (A) and to direct a first portion of the incoming light to the image sensor and a second portion of the incoming light to the reference sensor,
- wherein the optical multiplexer defines a first area for receiving the first portion of the incoming light and a second area for receiving the second portion of the incoming light, the second area radially surrounding the first area when viewed along the optical axis and projected onto a plane that is perpendicular to the optical axis (A), and
- wherein the optical multiplexer is arranged in the optical system in such a manner that the optical multiplexer directs the first portion of the incoming light, which impinges on the first area, to the image sensor and the second portion of the incoming light, which impinges on the second area, to the reference sensor.
A measurement device for determining optical properties of a sample surface, the measurement device comprising:
- at least one light source configured to illuminate a measurement spot on the sample surface along at least one illumination direction;
- and
- an optical system comprising:
- a spatially resolving image sensor the image sensor defining an image sensor plane, the optical system being configured to image a measurement plane onto the image sensor plane, the optical system defining an optical axis (A) between the measurement plane and the image sensor plane;
- a reference sensor;
- and
- an optical multiplexer configured to receive incoming light along the optical axis (A) and to direct a first portion of the incoming light to the image sensor and a second portion of the incoming light to the reference sensor,
- wherein the optical multiplexer defines a first area for receiving the first portion of the incoming light and a second area for receiving the second portion of the incoming light, the second area radially surrounding the first area when viewed along the optical axis and projected onto a plane that is perpendicular to the optical axis (A),
- wherein the optical multiplexer is arranged in the optical system in such a manner that the optical multiplexer directs the first portion of the incoming light, which impinges on the first area, to the image sensor and the second portion of the incoming light which impinges on the second area, to the reference sensor,
- wherein the optical axis of the optical system is oriented along an observation direction, and
- wherein the optical system is arranged to receive, as its incoming light (L), light that has been reflected from the measurement spot into the observation direction.
Dependencies are inferred from the claim text.