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US 12,556,321 B1Granted
Methods and oscilloscopes for measuring jitter in digital signals
AssigneeKeysight Technologies, Inc.
InventorDavid L. Gines
Life of this patent
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Abstract
A method for measuring even/odd jitter (EOJ) in digital signals includes receiving a signal under test (SUT), where the SUT includes a waveform of even symbols and odd symbols constituting an even-length test pattern. The method further includes generating a first pulse-fit vector for the even symbols of the waveform and a second pulse-fit vector for odd symbols of the waveform, and determining the EOJ of the SUT by measuring and comparing respective widths of the first and second pulse-fit vectors.
Claims20
A method for measuring even/odd jitter (EOJ) in digital signals, comprising:
- receiving a signal under test (SUT), the SUT including a waveform of even symbols and odd symbols constituting an even-length test pattern;
- generating a first pulse-fit vector for the even symbols of the waveform and a second pulse-fit vector for odd symbols of the waveform;
- and
- determining the EOJ of the SUT by measuring and comparing respective widths of the first and second pulse-fit vectors.
1 more element
An oscilloscope, comprising:
- an input port configured to receive a signal under test (SUT), the SUT including a waveform of even symbols and odd symbols constituting an even-length test pattern;
- a sampling circuit configured to sample the waveform of even symbols and odd symbols, and to output a digital signal corresponding to the waveform of even symbols and odd symbols;
- and
- a processor configured to process the digital signal by measuring even/odd jitter (EOJ) of the SUT by generating a first pulse-fit vector for the even symbols of the waveform and a second pulse-fit vector for odd symbols of the waveform, and by determining the EOJ of the SUT by measuring and comparing respective widths of the first and second pulse-fit vectors.
1 more element
Dependencies are inferred from the claim text.