Sample probe systems and associated methods

Abstract

In an example, a system includes a sample transfer assembly configured to convey ablated material from a sample to an analyzer inlet of an ion analyzer. The sample transfer assembly includes a sample transfer pipe and one or more gas inlets, each configured to receive a respective gas flow. A mass flow rate into the analyzer inlet is equal to or greater than a total mass flow rate of the gas flows into the one or more gas inlets. In another example, a method includes entraining ablated material in a sample material flow that flows within a sample transfer assembly, ionizing the ablated material, and conveying the ionized sample particles to an analyzer inlet of an ion analyzer. In another example, a computer-readable medium includes stored processor-executable instructions that, when executed by a processor, cause the processor to regulate a flow rate of a sample material flow.

Dependencies are inferred from the claim text.