Display device and method of predicting deterioration of display panel
AssigneeSamsung Display Co., Ltd.
InventorsSeung Jae Lee, Kuk Hwan Ahn, Dae Gwang Jang, Seong Heon Cho
Life of this patent
Estimating the term…
Abstract
According to an embodiment of the disclosure, a display device includes a display unit including a plurality of areas, a driver integrated circuit including a plurality of integrated circuits driving the display unit, and a storage medium configured to store temperature information of the display unit. Each of the temperature information includes data for temperature increment values for each area of the display unit when the driver integrated circuit is driven.
Claims18
A display device comprising:
- a display unit including a plurality of areas;
- a driver integrated circuit including a plurality of integrated circuits driving the display unit;
- and
- a storage medium configured to store temperature information of the display unit,
- wherein each of the temperature information includes data for temperature increment values for each area of the display unit when the driver integrated circuit is driven,
- wherein the plurality of integrated circuits include a first integrated circuit and a second integrated circuit,
- wherein the temperature information includes first temperature information and second temperature information,
- wherein the first temperature information is generated in a state in which the second integrated circuit is not driven and the first integrated circuit is driven, and
- wherein the second temperature information is generated in a state in which the first integrated circuit is not driven and the second integrated circuit is driven.
A method of predicting deterioration of a display panel including a display unit which includes a plurality of areas and a driver integrated circuit which includes a plurality of integrated circuits driving the display unit, the method comprising:
- driving the driver integrated circuit, measuring a front temperature of the display unit, generating temperature information based on the measured front temperature of the display unit, and storing the generated temperature information in a storage medium before shipment of a product,
- wherein generating the temperature information before shipment of the product comprises:
- calculating temperature increment values for each area of the display unit when the driver integrated circuit is driven, and
- converting the temperature increment values for each area into a percentage value,
- wherein the plurality of integrated circuits include a first integrated circuit and a second integrated circuit,
- wherein the temperature information includes first temperature information and second temperature information,
- wherein the first temperature information is generated in a state in which the second integrated circuit is not driven and the first integrated circuit is driven, and
- wherein the second temperature information is generated in a state in which the first integrated circuit is not driven and the second integrated circuit is driven.
A method of predicting deterioration of an electronic device including a display panel, the display panel including a display unit which includes a plurality of areas and a driver integrated circuit which includes a plurality of integrated circuits driving the display unit, the method comprising:
- driving the driver integrated circuit, measuring a front temperature of the display unit, generating temperature information based on the measured front temperature of the display unit, and storing the generated temperature information in a storage medium before shipment of a product;
- and
- generating a temperature map based on the temperature information after shipment of the product,
- wherein the generating the temperature information before shipment of the product comprises:
- calculating temperature increment values for each area of the display unit when the driver integrated circuit is driven, and
- converting the temperature increment values for each area into a percentage value,
- wherein the plurality of integrated circuits include a first integrated circuit and a second integrated circuit,
- wherein the temperature information includes first temperature information and second temperature information,
- wherein the first temperature information is generated in a state in which the second integrated circuit is not driven and the first integrated circuit is driven, and
- wherein the second temperature information is generated in a state in which the first integrated circuit is not driven and the second integrated circuit is driven.
Dependencies are inferred from the claim text.