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US 12,554,194 B2Granted
Conductive substrate comprising a conductive thin wire containing a metal and method of making thereof
AssigneeFUJIFILM Corporation
InventorsAya Nakayama, Katsuyuki Nukui, Yuya Motomura, Toru Ogawa, Shinichi Nakahira
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Abstract
A manufacturing method for a conductive substrate, with which a conductive substrate including a substrate and a conductive thin wire arranged on the substrate are manufactured, includes in the following order, a step 1 of forming a thin wire containing a metal on the substrate; a step 2 of bringing the thin wire into contact with a solution containing an organic acid; and a step 3 of subjecting the thin wire to a plating treatment to form a conductive thin wire.
Claims7
A conductive substrate comprising:
- a substrate;
- and
- a conductive thin wire arranged on the substrate and containing a metal,
- wherein a proportion of a region that shows the metal within a maximum inscribed circle of the observation region where the metal is observed is 81% to 99% in a vertical cross section of the conductive thin wire in a direction orthogonal to a direction in which the conductive thin wire extends,
- wherein a Gray value obtained by imaging the conductive thin wire using reflected light is 150 or less in terms of a value of brightness represented by 256 gradations,
- wherein a line width of the conductive thin wire is 0.1 μm or more and less than 5.0 μm, and
- wherein in a circumscribed quadrangle circumscribing the observation region where the metal is observed in which angles of four corners each have an angle of 90° and one side is parallel to a surface of the substrate, in a case where a quadrangle region of the circumscribed quadrangle on a side opposite to the surface of the substrate from an upper contact point which is set to one corner is defined as an upper circumscribed quadrangle, the upper contact point being located at a position farthest from the surface of the substrate among contact points between the observation region and sides of the circumscribed quadrangle perpendicular to the surface of the substrate, four corners of the upper circumscribed quadrangle each have an angle of 90°, and one side thereof is parallel to the surface of the substrate, and within the upper circumscribed quadrangle, in a case where a length of a contour of a region where the metal is present is denoted by Lm, a total length of four sides of the upper circumscribed quadrangle is denoted by Ls, and a ratio represented by Lm/Ls is denoted by γ, 1.3≤γ≤2.0 is satisfied.
4 more elements
Dependencies are inferred from the claim text.