System and method for magnetic resonance imaging

A method for magnetic resonance imaging (MRI), comprising:

• obtaining sets of under-sampled k-space data corresponding to multiple frames, wherein each of the sets of under-sampled k-space data corresponds to one frame of the frames and is acquired simultaneously from multiple slice locations of a subject in the corresponding frame using an MRI scanner, a random undersampling pattern is utilized in each of the frames;
• reconstructing, based on the sets of under-sampled k-space data of the frames, reference slice images, each of the reference slice images being representative of one of the slice locations in more than one frame of the frames;
• and
• reconstructing, based on the sets of under-sampled k-space data and the reference slice images, a plurality of image series each of which corresponds to one of the slice location and includes slice images of the corresponding slice location in the frames.

A system, comprising:

• at least one storage device storing a set of instructions for magnetic resonance imaging (MRI);
• and
• at least one processor configured to communicate with the at least one storage device, wherein when executing the set of instructions, the at least one processor is configured to direct the system to perform operations including:
• acquiring sets of echo signals of a subject corresponding to multiple frames, each of the sets of echo signals corresponding to one of the frames and being acquired by causing an MRI scanner to apply phase-encoding (PE) steps to N slice locations of the subject in the corresponding frame, N being a positive integer greater than 1;
• reconstructing at least one slice image based on the sets of echo signals, each slice image of the at least one slice image being representative of one slice location of the N slice locations in one frame of the frames, wherein
• for each of at least one slice location of the N slice locations,
• a phase of the slice location is modulated such that a global phase offset of the slice location is equal to (360*k/N) degrees, k being a positive integer, the global phase offset being a phase difference of the slice location between corresponding PE steps that are configured to sample PE lines at a same location in K-space and applied in adjacent frames of the frames.