Systems and methods for testing a capacitor in a circuit
AssigneeBorgWarner US Technologies LLC
InventorsKarthik Naik, Nomel Centino Navarro, Balasubramanian Muthuraman
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AssigneeBorgWarner US Technologies LLC
InventorsKarthik Naik, Nomel Centino Navarro, Balasubramanian Muthuraman
Estimating the term…
Disclosed techniques relate to a system for testing a capacitor. In an example, a testing circuit includes a testing voltage source configured to output a testing voltage to the capacitor; a discharge network configured to dissipate power from the capacitor; a voltage detection circuit configured to measure a voltage of the capacitor; a first switch configured to connect the capacitor to a main circuit; a second switch configured to connect the capacitor to the discharge network; a third switch configured to connect the capacitor to the testing voltage source; and a fourth switch configured to connect the capacitor to the voltage detection circuit; and one or more controllers. The controllers are configured to control an operation of the switches to test the capacitor using the testing voltage source, the discharge network, and the voltage detection circuit, and to determine, from the test, whether the capacitor is connected.
A system comprising:
A method comprising performing, with one or more controllers, operations including:
A system comprising:
Dependencies are inferred from the claim text.