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US 12,553,941 B2Granted
Automatic test equipment
AssigneeAdvantest Corporation
InventorsHiroki Ichikawa, Tasuku Fujibe
Life of this patent
Estimating the term…
Abstract
An interface device is provided between a test head and a DUT. In the interface device, each pin electronics IC is coupled to a DUT via an FPC cable.
Claims7
An interface device provided between a test head and a device under test (DUT), wherein a transmission path that couples a pin electronics Integrated Circuit (IC) and the DUT comprises a Flexible Printed Circuit (FPC) cable, wherein the pin electronics IC is provided as an internal component of the interface device, and
- wherein the interface device further comprises:
- a pin electronics printed circuit board structured to mount the pin electronics IC;
- and
- a first interposer structured to couple the pin electronics printed circuit board and the FPC cable.
1 more element
An interface device provided between a test head and a device under test (DUT), comprising:
- a socket board comprising a socket and a socket printed circuit board that mounts the socket;
- a second interposer having a first surface connected to a rear surface of the socket board;
- and
- a flexible printed circuit (FPC) cable connected to a second surface of the second interposer,
- wherein a connection is established between a pin electronics integrated circuit (IC) and the DUT via a transmission path formed by the FPC cable, the second interposer, and the socket board.
2 more elements
Dependencies are inferred from the claim text.